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Interrelationships and Path Analysis in the Component Characters of Photosynthetic Area and Yield in Wheat.

M.M. Islam
Plant Breeding Division, Bangladesh Institute of Nuclear Agriculture, Mymensingh-2202, Bangladesh.

M.T. Hossain
Department of Genetics and Plant Breeding Bangladesh Agricultural University Mymensingh-2202 Bangladesh

M.A. Islam
Department of Genetics and Plant Breeding Bangladesh Agricultural University Mymensingh-2202 Bangladesh

Abstract/ Executive Summary:

Eighteen genotypes of wheat were grown during 1994-95 to estimate correlation and path coefficients for the characters above flag leaf node, yield and yield components. Results of correlation studies showed that yield per plant had the greater relationships with flag leaf area. flag leaf sheath area, spike area. photosynthetic area. photosynthetic capability and grains per spike suggesting that yield per plant is very much influenced by these traits. Most of the interrelationships of different morpho-physiological characters were significant and positive. Path analysis suggested that spike area and flag leaf sheath area were the most important yield contributing traits in the materials studied. Selection based on spike area, flag leaf sheath area and flag leaf area is expected to be useful for the improvement of yield per plant in wheat.

Keywords: Correlation, Path analysis, Photosynthetic area, Yield, Wheat

Location: Field Laboratory of the Department of Genelics and Plant Breeding, Bangladesh Agricultural University (BAU), Mymensingh

Start Date:

End Date:

Program Area: Variety and Species

Commodity: Wheat

Objectives:

The present study was, therefore, taken up to with 18 genotypes of wheat to estimate correlation and path coefficients for detecting the traits need improvement in this crop.

Methodology:

This experiment was conducted at the Field Laboratory of the Department of Genetics and Plant Breeding, Bangladesh Agricultural University (BAU), Mymensingh during 1994-95. Eighteen wheat genotypes were used in this present study These genotypes were collected from Wheat Breeding Project, Department of Genetic and Plant Breeding, BAU, Mymensingh. Among these genotypes four were from Semi-Arid Nursery (SAN), two from Heat Tolerant Nursery (HTN), two from Durum (D), one from Yield Component (YC), eight from Drought Screening Nursery (DSN) and one local population variety (Kanchan). The seeds were sown on November 22, 1994. Five randomly chosen plants from each plot were harvested for recording observations. Data on the characters above flag leaf node were recorded according to Vellanki etal. (1986) as follows: Flag leaf area= lamina length x lamina width x 0.76 Flag leaf sheath area = leaf sheath length x diameter x ñ Spike area =(length x width of the second spikelet) x (no. of spikelet per spike) x 2 Photosynthetic are above flag node = flag leaf area + flag leaf sheath area + spike area Photosynthetic capability= Photosynthetic area above node x days from anthesis to maturity. Data on yield and other yield components such as spikes per plant, grains per spike, 100 grain weight and grain yield per plant were also recorded. According to methods as cited by Zaman et al (1982) correlation coefficient (r) was calculated. Path analysis was done as suggested by Dewey and Lu ( 1 959).

Source of Information: Bangladesh J. Agril. Sci. 27(1): 91-94, January, 2000

Article Link (Online Journal):

Funding Source:

Total Budget (Tk.) :

Achievement/Findings:

From the results of correlation coefficients it is evident that the photosynthetic area above flag leaf node with its components and also grains per spike made a large contribution to grain yield. Therefore, large and persistent photosynthetic area above the flag leaf node and grains per spike could be important selection criterion for yield in wheat. Path coefficient analysis indicated further that the spike area, flag leaf sheath area and flag leaf area were the most important component traits of yield per plant in the studied genotypes and more weightage should be given to select these characters to improve yield per plant of wheat.

Knowledge Management: Journal